Ken Krechmer’s Papers

  • “Cloud computing standardization” was submitted to the International Electrotechnical Commission (IEC) – IEEE (Institute of Electrical and Electronic Engineers) Challenge 2012. This paper received first prize, and was presented in Oslo, Norway, October 5, 2012. It has been published in How does electrotechnology impact economic, social and environmental development? Winning papers from the IEC-IEEE Challenge 2012, p. 15-25, Geneva, Switzerland. Copyright by the IEC, Geneva, Switzerland. All rights reserved. It is reproduced here with permission. Further information on the IEC is available from www.iec.ch.
  • “Quantifing Adaptability” was presented at ADAPTIVE 2010, The Second International Conference on Adaptive and Self-adaptive Systems and Applications, November 25, 2010 in Lisbon, Portugal, and received the Best Paper Award.
  • “The Entrepreneur and Standards” was originally submitted to the International Electrotechnical Commission (IEC) as part of the IEC Centenary Challenge 2006, organized in association with “The Economist”, and in partnership with the IEEE, the IET and VDE. This paper received the joint second prize on December 14, 2006. It has been published in International Standardization as a Strategic Tool: Commended Papers from the IEC Centenary Challenge 2006, p. 143-154. Geneva, Switzerland: International Electrotechnical Commission. It is copyright by the IEC, Geneva, Switzerland. All rights reserved. It is reproduced here with their permission. Further information on the IEC and the IEC Centenary Challenge is available from www.iec.ch.
  • Modeling System Variation was presented at the International Conference on Informatics in Control, Automation and Robotics (ICINCO) 2005 in Barcelona, Spain September 15, 2005.
  • Face the FACS (Formal worldwide, regional and national Agencies for Communications Standardization), paper presented at the Third IEEE Conference on Standardization and Innovation in Information Technology (SIIT 2003), October 22, 2003, Delft University of Technology, The Netherlands. In SIIT 2003 Proceedings, p. 141-148.